Reita, Carlo: search on Z-Library

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1

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Experimental Body-Input Three-Stage DC Offset Calibration Scheme for Memristive Crossbar

Mohan, Charanraj, Camunas-Mesa, L. A., Vianello, Elisa, Reita, Carlo, de la Rosa, Jose M., Serrano-Gotarredona, Teresa, Linares-Barranco, Bernabe

Year:

2020

File:

PDF, 4.20 MB

2020

2

[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - A Current Attenuator for Efficient Memristive Crossbars Read-Out

Mohan, Charanraj, de la Rosa, Jose M., Vianello, Elisa, Perniola, Luca, Reita, Carlo, Linares-Barranco, Bernabe, Serrano-Gotarredona, Teresa

Year:

2019

Language:

english

File:

PDF, 1.22 MB

english, 2019

3

Theory for field-effect mobility enhancement in multilayer structure thin-film transistors

Carlo Reita, Luigi Mariucci, Guglielmo Fortunato

Journal:

Journal of Non-Crystalline Solids

Year:

1989

Language:

english

File:

PDF, 180 KB

english, 1989

4

Experimental and theoretical evidence of space-charge photomodulation in metal/insulator/amorphous semiconductor structures

Guglielmo Fortunato, Luigi Mariucci, Carlo Reita, Valerio Parisi

Journal:

Journal of Non-Crystalline Solids

Year:

1989

Language:

english

File:

PDF, 195 KB

english, 1989

5

Transport properties of plasma-deposited amorphous silicon dioxide

Luigi Mariucci, Guglielmo Fortunato, Piero Foglietti, Carlo Reita, Dario Della Sala

Journal:

Journal of Non-Crystalline Solids

Year:

1989

Language:

english

File:

PDF, 205 KB

english, 1989

6

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Optical Microlithography XVIII - Complementary dipole exposure solutions at 0.29 k 1

Hendrickx, Eric, Smith, Bruce W., Torres, Andres, Lafferty, Neal, Le Cam, Laurent, Johnson, Stephen, Reita, Carlo, Vandenberghe, Geert, Maurer, Wilhelm

Year:

2005

Language:

english

File:

PDF, 4.72 MB

english, 2005

7

Advanced mask manufacturing

Journal:

Comptes Rendus Physique

Year:

2006

Language:

english

File:

PDF, 916 KB

english, 2006

8

Low voltage operation a-Si:H thin film transistors with very thin PECVD a-SiO2 gate dielectric

Guglielmo Fortunato, Luigi Mariucci, Carlo Reita, Piero Foglietti

Journal:

Journal of Non-Crystalline Solids

Year:

1989

Language:

english

File:

PDF, 174 KB

english, 1989

9

[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Technological and architectural approaches to neuro-inspired circuit implementations

Year:

2016

Language:

english

File:

PDF, 51 KB

english, 2016

10

From materials to products: a system perspective

Journal:

Thin Solid Films

Year:

1999

Language:

english

File:

PDF, 179 KB

english, 1999

11

[ECS 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) - Barga, Italy (July 28 - August 3, 2007)] ECS Transactions - The Small Differences between 45nm and 45 inches

Year:

2007

Language:

english

File:

PDF, 177 KB

english, 2007

12

[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Bulk-based DC offset calibration for low-power memristor array read-out system

Mohan, Charanraj, Camunas-Mesa, Luis A., Vianello, Elisa, Perniola, Luca, Reita, Carlo, de la Rosa, Jose M., Serrano-Gotarredona, Teresa, Linares-Barranco, Bernabe

Year:

2017

Language:

english

File:

PDF, 1.58 MB

english, 2017

13

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Special session on quantum systems: Next challenges in design, test, integration

Reita, Carlo, Baugh, Jonathan, Poulin-Lamarre, Gabriel, Kaminska, Bozena, Courtois, Bernard

Year:

2018

Language:

english

File:

PDF, 107 KB

english, 2018

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